Compiler Optimizations Impact the Reliability of the Control-Flow of Radiation-Hardened Software

Authors

  • Ronaldo Rodrigues Ferreira Instituto de Informática - Universidade Federal do Rio Grande do Sul
  • Rafael Baldiati Parizi Instituto de Informática - Universidade Federal do Rio Grande do Sul
  • Luigi Carro Instituto de Informática - Universidade Federal do Rio Grande do Sul
  • Álvaro Freitas Moreira Instituto de Informática - Universidade Federal do Rio Grande do Sul

Keywords:

Compilers, Radiation effects, Single event upsets, Software reliability, Software engineering

Abstract

http://dx.doi.org/10.5028/jatm.v5i3.224

This paper discusses how compiler optimizations influence software reliability when the optimized application is compiled with a technique to enable the software itself to detect and correct radiation-induced control-flow errors. Supported  by a comprehensive fault-injection campaign using an established benchmark suite in the embedded systems domain, we show that the compiler is a non-negligible source of noise when hardening the software against radiationinduced soft errors.


Author Biographies

Ronaldo Rodrigues Ferreira, Instituto de Informática - Universidade Federal do Rio Grande do Sul

PhD student in computer science.

Rafael Baldiati Parizi, Instituto de Informática - Universidade Federal do Rio Grande do Sul

Master student.

Luigi Carro, Instituto de Informática - Universidade Federal do Rio Grande do Sul

Full professor.

Álvaro Freitas Moreira, Instituto de Informática - Universidade Federal do Rio Grande do Sul

Associate Professor.

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Published

2013-08-27

Issue

Vol. 5 No. 3 (2013): Jul./Sep., 2013

Section

Original Papers

License

This work is licensed under a Creative Commons — Attribution 4.0 International — CC BY 4.0. Authors are free to Share (copy and redistribute the material in any medium or format) and Adapt (remix, transform, and build upon the material for any purpose, even commercially). JATM allow the authors to retain publishing rights without restrictions.